Description
Product Description

- Etched chrome-plated glass mask, used for filtering patterns in the Fourier plane;
- Image target formed by 10 types of chrome-plated glass microstructured patterns;
- Mask patterns include Fourier, Babinet, lattice grating, star grid, triangular grating, fan-shaped star and other patterns;
Place different masks, slits and diaphragms in the optical path of the Fourier plane in front of the beam splitter, so that changes in the pattern can be seen on the observation screen.
| Model | GMP-F |
| Specification | 75*25*1.0mm (±0.25) |
| Material | Quartz SiO₂, chrome-plated film |
| Weight | 4.9g |
Technical Description

(1) A method of using Fourier optics to manipulate the final image projected onto the camera. Place different masks, slits and diaphragms in the optical path of the Fourier plane in front of the beam splitter, so that changes in the pattern can be seen on the observation screen. The camera also shows the changes in the final image.

(2) The chrome-plated glass target provided in the kit has 10 different patterns and images for Fourier filtering. It includes different lattice gratings, Fourier, Babinet, lattice gratings, star grids, triangular gratings, fan-shaped stars and other patterns.

Manipulation of the Fourier Region
| Camera Image Operation | Fourier Plane | Pattern |
| None |
| ![]() |
| Add Horizontal Slit | ![]() | ![]() |
| Add Vertical Slit | ![]() | ![]() |
Manipulation of the Grid Region
| Camera Image Operation | Fourier Plane | Pattern |
| None | ![]() | ![]() |
| Add Horizontal Slit | ![]() | ![]() |
| Add Vertical Slit | ![]() | ![]() |
| Add 45° Left Slant Slit | ![]() | ![]() |
| Add 45° Right Slant Slit | ![]() | ![]() |
Verification of Babinet’s Principle
| Camera Image Operation | Fourier Plane | Pattern |
| None | ![]() | ![]() |
| Add Circular Dot Mask | ![]() | ![]() |
Assembly

Application Examples























