Description
Product Description
- Oeabt teaching demonstration series products are designed to promote the development of physics, optics, photonics and various emerging research fields through various classic experiments. Each teaching kit contains all necessary components and an instruction manual with detailed device descriptions and teaching operation guidelines.
The Michelson interferometer is an experimental kit that measures optical path difference based on the principle of light interference.
| Light Source Components | Light Source Components | Light Source Components | Light Source Components |
| Item | Model | Remarks | Quantity |
| Ø12mm Laser Source | OM-12A515-3-G | Wavelength 515nm, Power 3mW | 1 |
| Laser Mounting Hole | OAD-POL-12 | Mounting Aperture: Ø12mm | 1 |
| Cage Adjustable Mirror Mount | MC-S1 | Smooth Hole Type, Compatible with Ø1-inch Optical Components, ±5° Tilt and ±3mm Translation | 1 |
| Item | Model | Remarks | Quantity |
| LED Light Source | LED-C-MAX4K | White Light 4000-4500K, Output Voltage: DC 12V, Power 3W Max | 1 |
| Ø1-inch Lens Sleeve | CSB-24 | SM1 Internal Thread, L=16mm, with 2 Retaining Rings | 1 |
| Ring-Driven Adjustable Diaphragm | CDM-12 | Light Transmission Aperture: Ø1mm~12mm; SM1 Internal and External Threads | 1 |
| Sleeve Clamp Ring | SCR1 | Clamps Ø1-inch Sleeve to Rod, M4 Screw Hole at the Bottom | 1 |
| Reflector Components | Reflector Components | Reflector Components | Reflector Components |
| Item | Model | Remarks | Quantity |
| Aluminum Film Reflector | TFA-C1 | Ø25.4*5mm, Applicable Wavelength: 380-780nm | 2 |
| Two-Axis Adjustable Mirror Mount | MK100-A | Compatible with Ø1-inch Optical Components, Adjustable Tilt ±4° | 1 |
| Z-Axis Translation Mount | CMSA-Z | Axial: Z-Axis Displacement 1.2mm, Graduation 5μm; Mounts Ø25.4mm Lens | 1 |
| Beam Splitter Components | Beam Splitter Components | Beam Splitter Components | Beam Splitter Components |
| Item | Model | Remarks | Quantity |
| Beam Splitter Cube | M2-BS1 | Pre-installed Component, CSL30-M Cube + CSMH-25.4-M Beam Splitter Prism (Applicable 400-700nm) | 1 |
| Lens Components | Lens Components | Lens Components | Lens Components |
| Item | Model | Remarks | Quantity |
| Biconvex Lens | OLB-I1-50.8PM | Ø1 inch, f=50.8mm, Anti-Reflection Coating: 400-700nm | 1 |
| Lens Mount | SM-R1 | Compatible with Ø1-inch Optical Components, SM1 Thread | 1 |
| Polarizer Components | Polarizer Components | Polarizer Components | Polarizer Components |
| Item | Model | Remarks | Quantity |
| Flat Plate Holding Arm | FFCA | Clamping Thickness: 0.8-2.3mm | 1 |
| Rotary Mount | R-TSX-M | 60° Coarse Adjustment Rotation, 5° Fine Adjustment Stroke; Load Capacity: Coarse Adjustment 11.4kg, Fine Adjustment 1.7kg | 1 |
| Glass Plate | — | — | 1 |
| Thermal Expansion Components | Thermal Expansion Components | Thermal Expansion Components | Thermal Expansion Components |
| Item | Model | Remarks | Quantity |
| Heating Aluminum Rod Accessories | — | Heating Sheet, Polyimide Heating Film: 30*40mm, Voltage and Power: 5V 1W | 3 |
| CSB-16 | Ø1-inch Sleeve, SM1 Internal Thread, L=16mm, with 2 Retaining Rings | 1 | |
| SM1-M4A | SM1 to M4 Thread Adapter | 1 | |
| TFA-C1 | Ø25.4*5mm, Applicable Wavelength: 380-780nm | 1 | |
| — | Heating Aluminum Rod | 1 | |
| — | DC 5V Power Supply | 1 | |
| Thermometer Controller | — | Measurement Range: -199.9℃-1360℃; Temperature Coefficient: Less than 0.1 times the Accuracy Specification ℃ (°F); Input Protection: Maximum Input Voltage DC 60V, AC 24V | 1 |
| Mechanical Components | Mechanical Components | Mechanical Components | Mechanical Components |
| Item | Model | Remarks | Quantity |
| Optical Breadboard | OHD4060-A | 400*600*13mm, M6 Screw Hole Array, 5 Counterbores | 1 |
| Angle Fixture | PC12-A12 | Fixture Angle: 90°, Compatible with Ø12.7mm Rods | 1 |
| Rod Holder | CAT57-T | Telescopic Rod Holder, L=57mm, Knob Height 8mm, Compatible with Ø12.7mm Rods, M6 Screw Holes | 5 |
| PCAH2-S | Ø12.7mm Rod, L=50.8mm, M4 Screw Hole on One End and M6 Screw Hole on the Other End | 7 | |
| PCA31-S | Rod Base, M6 Bolt | 5 | |
| M-BASE-C | Fork-Type Pressure Plate, Fixing the Position of the Rod Holder | 5 | |
| Light Spot Observation White Screen | PIS-A2 | White Board: 148*90*4.4mm | 1 |
| CFP0.5-S【M4】 | White Screen Rod, Ø1 inch, L=12.7mm | 1 | |
| Tools and Accessories | MHR-BX | Magnetic Straightedge with Metric/Imperial Scale | 1 |
| SPW-TH | Wrench Tool Holder, Including 7 Hand-Tightening Screws and 7 Hex Wrenches | 1 | |
| SPW-SM150 | Retaining Ring Wrench, L=50mm, with Scale, Compatible with SM1 Retaining Rings | 1 | |
| Screw Pack | Complimentary | – |
Technical Description
☑ Michelson Interferometer Experiment
—— Experiment Summary:
The Michelson interferometer is an experimental kit that measures optical path difference based on the principle of light interference. The basic model of the interferometer is easy to adjust; by adjusting the arm length, periodic changes of the interference pattern can be observed, helping to understand the interference phenomenon and the phase difference of light waves. When a white LED light source is introduced, light waves of different wavelengths form their own interference patterns, revealing the complexity of light waves and applying to spectral analysis. In addition, it is also widely used in fields such as physics, chemistry, and materials science. For example, the refractive index of organic glass plates can be measured by adjusting the optical path length; the coefficient of thermal expansion of solids can be measured by heating metal rods and recording changes in interference fringes.
—— Experimental Principle:
The specific steps are as follows:
(1) Beam Splitting: The incident beam is split into two beams (Beam A and Beam B) by the beam splitter.
(2) Path Propagation: Beam A is reflected back to the beam splitter by one reflector, and Beam B is reflected back to the beam splitter by another reflector.
(3) Beam Recombination: The two beams meet again at the beam splitter and interfere.
(4) Observation of Interference Pattern: The recombined beam forms an interference pattern on the observation screen. By analyzing the position and changes of these interference fringes, information about the optical path difference can be obtained.
—— Experimental Objectives:
(1) Measuring Optical Path Difference: Precisely measure tiny length changes and displacements, applied in precision machinery and nanotechnology.
(2) Refractive Index Measurement: The refractive index of different media can be determined by measuring changes in interference fringes.
(3) Spectral Analysis: Used for high-precision wavelength measurement and spectral analysis.
(4) Materials Science: Measure the coefficient of thermal expansion and other optical properties of materials.
(5) Basic Physics Experiments:
- Michelson-Morley Experiment: Used to detect the existence of the ether, which ultimately supported the theory of relativity.
- LIGO: Detect gravitational waves using the principle of interferometers.
—— Kit List:
The Michelson interferometer uses the principle of light interference for measurement, mainly used to measure the phase change and optical path difference of light. It generates interference patterns by separating and recombining light beams, enabling precise measurement and analysis.
—— Experimental Content
Each teaching kit contains all necessary components and an instruction manual with detailed device descriptions and teaching operation guidelines.
Assembly
Application Examples
